The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2026

Filed:

Jan. 18, 2022
Applicant:

A&d Company, Limited, Tokyo, JP;

Inventors:

Hideki Otsuka, Saitama, JP;

Tsutomu Kowa, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G 23/01 (2006.01); G01G 19/00 (2006.01);
U.S. Cl.
CPC ...
G01G 23/01 (2013.01); G01G 19/00 (2013.01);
Abstract

Provided is a weighing apparatus that enables occurrence of an abnormality to be noticed. A weighing apparatus includes a rectangular weighing base, weighing sensors disposed at four corners of the weighing base, a control unit configured to calculate a weighed value of a to-be-weighed object on the weighing base based on outputs of the weighing sensors, and an abnormality detection means configured to detect occurrence of an abnormality based on output values of the weighing sensors, and detects occurrence of an abnormality by comparing a sum of output values of a pair of weighing sensors disposed on one side of the weighing base among the weighing sensors with a sum of past output values of the pair of weighing sensors.


Find Patent Forward Citations

Otsuka, Hideki. (2026). Weighing apparatus having an abnormality detection means (U.S. Patent No. 12529593). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12529593

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…