Fukuoka, Japan

Hideaki Fujikake

This inventor holds 1 USPTO granted patent. Top assignee: Seiko Epson Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideaki Fujikake. Retrieved from https://idiyas.com/inventor/hideaki-fujikake

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Innovations by Hideaki Fujikake

Introduction

Hideaki Fujikake is a notable inventor based in Fukuoka, Japan. He has made significant contributions to the field of semiconductor technology. His work focuses on improving the efficiency and accuracy of hardware and software co-verification methods.

Latest Patents

Fujikake holds a patent for a "Method for co-verifying hardware and software for a semiconductor device." This innovative method achieves fast simulation execution by implementing a C-based native code simulation without degrading the accuracy of timing verification. The process involves using a host CPU to co-verify hardware and software components, ensuring that both are accurately tested in conjunction.

Career Highlights

Fujikake is currently employed at Seiko Epson Corporation, where he continues to develop cutting-edge technologies. His expertise in semiconductor devices has positioned him as a key player in the industry. He has successfully contributed to advancements that enhance the performance of electronic devices.

Collaborations

Fujikake has worked alongside talented colleagues such as Hiroyuki Yamashita and Takao Shinsha. Their collaborative efforts have led to innovative solutions in the semiconductor field.

Conclusion

Hideaki Fujikake's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing the industry. His work continues to influence the development of efficient hardware and software verification methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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