Suwon, South Korea

Heon-gwon Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Heon-gwon Lee. Retrieved from https://idiyas.com/inventor/heon-gwon-lee-i6fdc886

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Heon-gwon Lee: Innovator in Semiconductor Testing Technology

Introduction

Heon-gwon Lee is a notable inventor based in Suwon-si, South Korea. He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for testing semiconductor apparatuses.

Latest Patents

Heon-gwon Lee holds a patent for a "Method and equipment for testing semiconductor apparatuses simultaneously and continuously." This method involves mounting multiple semiconductor apparatuses on a first test board. The process includes loading test software into the test circuits of these apparatuses and performing self-tests based on the software. Once the self-tests are completed, the apparatuses are removed from the first test board. Meanwhile, the test software is loaded into the test circuits of additional semiconductor apparatuses on a second test board, allowing for efficient testing.

Career Highlights

Heon-gwon Lee is currently employed at Samsung Electronics Co., Ltd., a leading company in the electronics industry. His work focuses on enhancing the efficiency and effectiveness of semiconductor testing processes.

Collaborations

Heon-gwon Lee has collaborated with notable colleagues, including Eun-sik Kim and Kil-yeon Kim. Their teamwork has contributed to advancements in semiconductor technology.

Conclusion

Heon-gwon Lee's innovative methods in semiconductor testing exemplify the importance of continuous improvement in technology. His contributions are paving the way for more efficient testing processes in the semiconductor industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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