Company Filing History:
Years Active: 1999-2001
Title: The Innovations of Henry Y Pun
Introduction
Henry Y Pun is a notable inventor based in Santa Clara, CA. He has made significant contributions to the field of integrated circuit testing, holding a total of 4 patents. His work has advanced the technology used in testing devices, making them more efficient and reliable.
Latest Patents
One of his latest patents is an "Integrated circuit tester with compensation for leakage current." This invention involves a module where pin electronics circuitry supplies leakage current to a circuit node connected to a signal pin of a device under test. The leakage current is compensated by connecting the circuit node to a voltage source at a first potential level, supplying current from a second potential level, and measuring the current supplied to the circuit node from the voltage source. The second potential level is selectively varied to reduce the current supplied from the voltage source substantially to zero before disconnecting the circuit node from the voltage source.
Another significant patent is the "Integrated circuit tester with test head including regulating capacitor." This invention measures the current consumption of a device under test (DUT) using a tester that includes a device power supply (DPS). The DUT is received by a load board with contact elements in electrically conductive pressure contact with the power supply terminals. A circuit branch, including a bypass capacitor and an nMOSFET, is connected between the force and return lines, enhancing the testing process.
Career Highlights
Henry Y Pun has been instrumental in the development of advanced testing technologies at Credence Systems Corporation. His innovative approaches have led to improvements in the accuracy and efficiency of integrated circuit testing.
Collaborations
He has collaborated with notable coworkers such as Jeffrey D Currin and Michael R Ferland, contributing to various projects that have pushed the boundaries of technology in their field.
Conclusion
Henry Y Pun's contributions to integrated circuit testing through his patents and collaborations have significantly impacted the industry. His work continues to inspire advancements in technology and innovation.