This inventor holds 1 USPTO granted patent. Top assignees: Développement Des Méthodes Et Processus Industriels, Safran/association Pour La Recherche Et Le. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Henry Proudhon: Innovator in X-ray Imaging Systems
Introduction
Henry Proudhon is a notable inventor based in Moissy-Cramayel, France. He has made significant contributions to the field of x-ray imaging systems, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of x-ray measurements.
Latest Patents
Henry Proudhon holds a patent for a "Device and method for measuring angles of orientation of an x-ray imaging system." This invention includes an x-ray source, an x-ray detector, and a sample holder designed to receive a sample for analysis. The method involves emitting a polychromatic x-ray beam through a reference sample to create a diffraction pattern on the x-ray detector's sensing area. By generating an observed image that includes this diffraction pattern, the orientation of both the x-ray source and detector can be determined by comparing it with a target image obtained under preset conditions. This innovative approach enhances the precision of x-ray imaging.
Career Highlights
Throughout his career, Henry Proudhon has worked with prominent companies such as Safran and the Association Pour La Recherche Et Le Développement Des Méthodes Et Processus Industriels. His experience in these organizations has contributed to his expertise in the field of x-ray technology.
Collaborations
Henry has collaborated with talented individuals such as Alexiane Arnaud and Clément Remacha. These partnerships have likely enriched his work and led to further advancements in his projects.
Conclusion
Henry Proudhon is a distinguished inventor whose work in x-ray imaging systems has made a significant impact. His innovative patent demonstrates his commitment to improving measurement techniques in this critical field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile