Location History:
- Planegg, DE (1996)
- Krailing, DE (2005)
Company Filing History:
Years Active: 1996-2005
Title: Helmut Witek: Innovator in Spectroscopic Ellipsometry
Introduction
Helmut Witek is a notable inventor based in Krailing, Germany. He has made significant contributions to the field of spectroscopic ellipsometry, holding 2 patents that enhance the capabilities of optical measurement technologies.
Latest Patents
Witek's latest patents include an innovative ellipsometer designed for the examination of samples. This ellipsometer features a broadband light source on the emitter side and a detector on the receiver side, allowing for precise measurement of light reflected from the sample. Additionally, it incorporates a refractive optic to generate a defined measuring spot on the sample, along with an aperture for spot definition. His second patent focuses on a method for determining characteristic values of transparent layers in the nanometer range, such as layer thickness and refractive index. This method allows for the measurement of ellipsometric angles and the determination of characteristic values even with less complex ellipsometers.
Career Highlights
Helmut Witek is associated with Sentech Instruments GmbH, where he applies his expertise in optical technologies. His work has significantly advanced the field of ellipsometry, making it more accessible and efficient for various applications.
Collaborations
Witek collaborates with esteemed colleagues, including Uwe Wielsch and Uwe Richter, contributing to the development of innovative optical measurement solutions.
Conclusion
Helmut Witek's contributions to spectroscopic ellipsometry exemplify his commitment to innovation in optical technologies. His patents and collaborative efforts continue to influence the field positively.