Stuttgart, Germany

Helge Ketelsen

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Helmut Fischer Gmbh Institut Fuer Elektronik Und Messtechnik. Active years: 2026.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Helge Ketelsen: Innovator in Terahertz Technology

Introduction

Helge Ketelsen is a notable inventor based in Stuttgart, Germany. He has made significant contributions to the field of terahertz technology, particularly in the development of methods for analyzing material properties. His innovative approach has garnered attention in both academic and industrial circles.

Latest Patents

Helge Ketelsen holds a patent for a "Method and device for determining at least one property of at least one layer using terahertz radiation." This patent outlines a method for determining properties of a first layer that can be applied to a substrate using terahertz radiation. The process involves determining at least one property of the substrate, applying the first layer, and then assessing the properties of that layer. This innovative method enhances the understanding of material characteristics in various applications.

Career Highlights

Helge Ketelsen is associated with Helmut Fischer GmbH Institut für Elektronik und Messtechnik, where he applies his expertise in terahertz technology. His work at this esteemed institution has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of his notable coworkers include Lars-Christian Anklamm and Jens Maisenbacher. Their collective efforts contribute to advancing the research and application of terahertz technology.

Conclusion

Helge Ketelsen's work in terahertz technology exemplifies innovation in material analysis. His contributions through patents and collaboration with esteemed colleagues highlight his role as a key figure in this specialized field.

Profile summary based on public USPTO records.
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