The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2026

Filed:

Oct. 08, 2021
Applicant:

Helmut Fischer Gmbh Institut Fuer Elektronik Und Messtechnik, Sindelfingen, DE;

Inventors:

Ruediger Maestle, Boeblingen, DE;

Lars-Christian Anklamm, Berlin, DE;

Jens Maisenbacher, Magstadt, DE;

Helge Ketelsen, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/3563 (2014.01); G01N 21/3581 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); G01N 21/3581 (2013.01);
Abstract

Method for determining at least one property of at least one first layer than can be applied to a substrate using terahertz, THz, radiation, comprising: determining at least one property of the substrate, applying the first layer to the substrate, determining the at least one property of the first layer.


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