South Lake Tahoe, CA, United States of America

Helen Vo

This inventor holds 1 USPTO granted patent. Top assignee: Bae Systems Information and Electronic Systems Integration Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Helen Vo. Retrieved from https://idiyas.com/inventor/helen-vo-uii4web0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Helen Vo and Hybrid PCB Defect Detection

Introduction

Helen Vo is an inventor based in South Lake Tahoe, California. Her patent work addresses automated inspection of printed circuit boards (PCBs), combining model-based techniques with machine learning to identify potential defects.

Latest Patents

Vo is associated with 1 patent: “Hybrid MB/ML Techniques for Automated Printed Circuit Board (PCB) Defect Detection.” The invention describes a PCB inspection system that captures images automatically and processes them using both model-based and machine-learning methods. It fuses features from the two approaches in a latent representation, then uses an autoencoder trained to recognize features of interest and reconstruct an image. The system compares the reconstructed image with the original to calculate a reconstruction error. When that error exceeds a threshold, the system indicates a possible defect in one or more features of interest.

Career Highlights

Vo is associated with BAE Systems Information and Electronic Systems Integration Inc. Her patent reflects work on applying combined analytical and machine-learning methods to automated quality inspection.

Collaborations

The provided information lists Tao Wang and Helen F. Webb as Vo’s coworkers. The patent’s hybrid approach brings together model-based processing and machine learning for PCB defect detection.

Conclusion

Helen Vo’s patent focuses on an automated PCB inspection system that uses image reconstruction and threshold-based analysis to flag potential defects.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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