The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Jun. 20, 2023
Applicant:

Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);

Inventors:

Tao Wang, Belmont, MA (US);

Helen Vo, South Lake Tahoe, CA (US);

Helen F. Webb, Malden, MA (US);

Victor T. Tom, Bedford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/44 (2022.01); G06T 7/00 (2017.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06V 10/44 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30141 (2013.01);
Abstract

Hybrid MB/ML techniques for automated printed circuit board (PCB) defect detection. In one example, a PCB inspection system implements a hybrid solution using model based (MB) and machine learning (ML) technologies to detect possible defects in a PCB via an automated image capture device and processing methodology. The processing methodology fuses features from MB and ML at the latent representation. An autoencoder can be used to learn the fused data by training a neural network to produce a reconstructed image that can be compared to an original image to generate a reconstruction error value. The system produces an output indicating detection of a defect in one or more features of interest based on the reconstruction error value transgressing a threshold value.


Find Patent Forward Citations

Wang, Tao. (2026). Hybrid mb/ml techniques for automated pcb defect detection comprising an inspection module including an autoencoder trained to recognize at least one feature of interest, and a defect detection module (U.S. Patent No. 12762691). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762691

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…