This inventor holds 1 USPTO granted patent. Top assignee: Koninklijke Philips Corporation N.v.. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: Heinz Van Der Broeck: Innovator in X-ray Technology
Introduction
Heinz Van Der Broeck is a notable inventor based in Zülpich, Germany. He has made significant contributions to the field of X-ray technology, particularly through his innovative patent that enhances the efficiency of X-ray examination apparatus.
Latest Patents
Heinz Van Der Broeck holds a patent for an "X-ray detector provided with integrated cooling." This invention relates to an X-ray examination apparatus where both the X-ray detector and the X-ray source are maintained at a constant temperature through a shared cooling circuit. The cooling medium, applied at a constant temperature, ensures that the X-ray detector operates under uniform ambient conditions. This design not only simplifies the construction of the X-ray examination apparatus but also prolongs the service life of electronic components by maintaining a low temperature. Additionally, it allows the apparatus to operate at a higher mean power due to effective cooling.
Career Highlights
Heinz Van Der Broeck is associated with Koninklijke Philips Corporation N.V., a leading company in the field of healthcare technology. His work at Philips has been instrumental in advancing X-ray technology, contributing to improved diagnostic capabilities in medical imaging.
Collaborations
Heinz collaborates with Falko Busse, who is also involved in the development of innovative technologies within the company. Their partnership exemplifies the collaborative spirit that drives advancements in the field.
Conclusion
Heinz Van Der Broeck's contributions to X-ray technology through his innovative patent demonstrate his commitment to enhancing medical imaging. His work not only improves the functionality of X-ray examination apparatus but also sets a standard for future innovations in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
