The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2003

Filed:

Nov. 26, 2001
Applicant:
Inventors:

Falko Busse, Aachen, DE;

Heinz Van der Broeck, Zuelpich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/510 ;
U.S. Cl.
CPC ...
H01J 3/510 ;
Abstract

The invention relates to an X-ray examination apparatus in which the X-ray detector and the X-ray source are subject to keeping the temperature constant and to cooling by way of a common cooling circuit. To this end, a cooling medium of constant temperature is applied to the X-ray detector in order to make the X-ray detector operate at uniform ambient temperatures. The temperature of the cooling medium, thus increased a first time, still suffices to perform cooling of the X-ray source Consequently, the heated cooling medium, after application to the X-ray detector , is applied to the X-ray source where a second exchange of heat takes place, so that at the same time the X-ray source is cooled without utilizing an additional cooling circuit. This offers the advantage that relevant X-ray examination apparatus may have a simple construction, that the electronic components used in the construction have a correspondingly prolonged service life due to the constant low temperature, and that the apparatus can operate with a higher mean power as a result of the cooling.


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