Company Filing History:
Years Active: 2007
Title: Heiner Jaksch: Innovator in Scanning Electron Microscopy
Introduction
Heiner Jaksch is a notable inventor based in Heidenheim, Germany. He has made significant contributions to the field of scanning electron microscopy, particularly through his innovative patent. His work has implications for enhancing the capabilities of electron microscopes, which are essential tools in various scientific and industrial applications.
Latest Patents
Heiner Jaksch holds a patent for a "Detector system for a scanning electron microscope and a scanning electron microscope incorporating said detector system." This invention features a detector system designed for the specimen chamber of a scanning electron microscope. It allows for the simultaneous detection of signals in transmission that correspond to both light field contrast and dark field contrast. The system includes four detectors arranged in a plane, with an aperture for free access of electrons. A further detector is positioned in a second plane, enhancing the functionality of the microscope. The design minimizes dead spaces that are not sensitive to electrons, thereby improving the overall efficiency of the detection process.
Career Highlights
Heiner Jaksch is currently employed at Carl Zeiss NTS GmbH, a leading company in the field of optical and electron microscopy. His role involves developing advanced technologies that push the boundaries of what is possible in microscopy. His innovative spirit and technical expertise have made him a valuable asset to the company.
Collaborations
Heiner collaborates with Johannes Bihr, working together to advance the technology and applications of scanning electron microscopy. Their combined efforts contribute to the ongoing development of innovative solutions in the field.
Conclusion
Heiner Jaksch's contributions to scanning electron microscopy through his patented detector system exemplify the importance of innovation in scientific research. His work not only enhances the capabilities of electron microscopes but also paves the way for future advancements in the field.