Buenos Aires, Argentina

Hector H Velasco

This inventor holds 1 USPTO granted patent. Top assignee: U.S. Philips Corporation. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hector H Velasco. Retrieved from https://idiyas.com/inventor/hector-h-velasco

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Hector H Velasco: Innovator in Electron Gun Inspection

Introduction

Hector H Velasco is a notable inventor based in Buenos Aires, Argentina. He has made significant contributions to the field of electron gun technology. His innovative approach has led to the development of a unique method and device for inspecting electron guns.

Latest Patents

Hector holds a patent for a "Method and device for inspecting an electron gun." This invention involves an assembly of electrodes for an electron gun that is inspected through a sophisticated process. The relative positions of multiple apertures, ideally four, are determined using two optical systems. One system focuses on the positions of two apertures of electrodes, such as the G1 and G2 electrodes, while the other system determines the position of the remaining aperture or apertures.

Career Highlights

Hector is currently employed at U.S. Philips Corporation, where he continues to work on advancements in electron technology. His expertise and innovative mindset have made him a valuable asset to the company.

Collaborations

Hector has collaborated with Pieter C Scholten, further enhancing the development of technologies related to electron guns.

Conclusion

Hector H Velasco's contributions to the field of electron gun inspection demonstrate his innovative spirit and dedication to advancing technology. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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