The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2000
Filed:
Apr. 14, 1999
Applicant:
Inventors:
Pieter Scholten, Eindhoven, NL;
Hector H Velasco, Buenos Aires, AR;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
445-4 ; 445 64 ;
Abstract
An assembly of electrodes for an electron is inspected. The relative positions of a number of apertures (at least three but preferably four) is determined by means of two optical systems, one for determining the positions of two apertures of electrodes, e.g. the G1 and the G2 electrode, the other for determining the position of the other aperture or apertures.
Scholten, Pieter. (2000). Method and device for inspecting an electron gun (U.S. Patent No. 6036564). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6036564
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile