Santa Clara, CA, United States of America

Hassan Ali

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Applied Materials, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hassan Ali. Retrieved from https://idiyas.com/inventor/hassan-ali-ic8wevui

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hassan Ali: Inventor in Gas Distribution System Monitoring

Introduction

Hassan Ali is an inventor based in Santa Clara, California, and is associated with Applied Materials, Inc. His patent work addresses monitoring gas distribution systems and identifying malfunctions within them.

Latest Patents

The provided information lists 1 patent for Hassan Ali: “Systems and Methods for Detecting Malfunctions Within a Gas Distribution System.” The invention describes enabling gas flow through a system’s flow path and analyzing pressure or flow-rate data collected while the gas is moving. If the system detects a malfunction, it can estimate the malfunction’s location relative to a mass flow controller or sensor and generate a report with the findings.

Career Highlights

Ali’s listed invention focuses on detecting and locating faults in gas distribution systems. The approach combines flow-path monitoring, data processing, and reporting to help identify whether a malfunction has occurred and where it may be situated.

Collaborations

The supplied information names Daemian Raj Benjamin Raj and Travis Clark Mazzy as Ali’s coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.

Conclusion

Hassan Ali’s listed patent centers on a practical method for monitoring gas flow and detecting the relative location of system malfunctions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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