Yokohama, Japan

Haruyoshi Ono

This inventor holds 2 USPTO granted patents. Top assignee: Sumitomo Electric Device Innovations, Inc.. Active years: 2012-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haruyoshi Ono. Retrieved from https://idiyas.com/inventor/haruyoshi-ono-n1u8rsg1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.4

ph-index = 1


Location History:

  • Kanagawa, JP (2012)
  • Yokohama, JP (2016)

Company Filing History:


Years Active: 2012-2016

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Haruyoshi Ono: Innovator in Semiconductor Testing Technologies

Introduction

Haruyoshi Ono is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of semiconductor testing, holding a total of 2 patents. His work focuses on developing advanced testing apparatuses and methods that enhance the efficiency and accuracy of semiconductor laser evaluations.

Latest Patents

One of Haruyoshi Ono's latest patents is a test apparatus designed to streamline the testing process for devices under test (DUT). This apparatus includes test target sections with connectors for DUTs, measuring sections equipped with measuring devices, and a switch section controlled by a controller. The controller can select algorithms to either search for available measuring sections or maintain a previously established connection.

Another notable patent is a testing method for semiconductor lasers. This method involves obtaining the length of an optical fiber that meets a reference dispersion condition for a specific wavelength. It also includes inputting a modulated laser light signal into an optical fiber of the same length and evaluating the output, which is crucial for ensuring the performance of semiconductor lasers.

Career Highlights

Haruyoshi Ono is currently employed at Sumitomo Electric Device Innovations, Inc., where he continues to innovate in the field of semiconductor technology. His work has been instrumental in advancing testing methodologies that are essential for the development of high-performance semiconductor devices.

Collaborations

Throughout his career, Haruyoshi has collaborated with notable colleagues, including Isao Baba and Makoto Sugiyama. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Haruyoshi Ono's contributions to semiconductor testing technologies reflect his dedication to innovation and excellence. His patents not only enhance testing processes but also pave the way for advancements in semiconductor applications. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…