Location History:
- Chiba, JP (2000 - 2014)
- Tokyo, JP (1979 - 2021)
Company Filing History:
8 out of 223 
4 out of 223 
3 out of 2,899 
Years Active: 1979-2021
Title: **Haruo Takahashi: A Pioneer in X-ray Inspection Technology**
Introduction
Haruo Takahashi, based in Chiba, Japan, is a notable inventor with a remarkable portfolio of 15 patents. His innovations have significantly contributed to the field of X-ray inspection technologies. His recent inventions showcase advanced methodologies and apparatuses, reflecting his commitment to enhancing diagnostic efficiency and safety.
Latest Patents
Takahashi's latest patents include an **X-ray inspection apparatus and an X-ray inspection method**. The apparatus comprises an X-ray source, a sample moving mechanism, a Time Delay Integration (TDI) sensor, and a TDI computing unit. This innovative setup allows for the precise detection of samples through a determination region, enabling the efficient transfer of data related to accumulated charges from the detected pixels.
Another significant contribution is his patent for an **X-ray generator and fluorescent X-ray analyzer**. This invention includes a sophisticated X-ray tube specifically designed to radiate primary X-rays onto a specimen and features a radiation area controller that effectively limits the X-ray exposure. The thoughtful design enhances both the functionality and safety of X-ray applications.
Career Highlights
Throughout his career, Haruo Takahashi has been associated with leading companies such as SII Nanotechnology Inc. and Hitachi High-Tech Science Corporation. His work in these organizations has positioned him at the forefront of X-ray technology developments, allowing him to translate innovative concepts into practical applications.
Collaborations
Takahashi has collaborated with notable professionals in his field, including Toshiaki Fujii and Yo Yamamoto. These partnerships have enabled the exchange of ideas and expertise, further promoting advancements in X-ray inspection technologies.
Conclusion
Haruo Takahashi continues to be a key figure in the realm of X-ray inspection innovation, underscored by his substantial contribution of patents and collaborative efforts with fellow inventors. His commitment to excellence and innovation not only establishes his legacy but also paves the way for future advancements in this critical area of technology.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.