Hardik Bhagat

Title: Hardik Bhagat: Innovator in Scan Compression

Introduction

Hardik Bhagat is an inventor based in Karnataka, India, whose patent work addresses scan testing for integrated circuits. His listed patent count is 1 patent, and he is associated with International Business Machines Corporation.

Latest Patents

Bhagat’s patent, “Scan Compression Ratio Based on Fault Density,” describes a processor-implemented method for setting scan compression ratios across integrated-circuit partitions. The method calculates a fault-density value for each partition by comparing its total number of faults with its total number of flip-flops. A processor then determines a compression ratio for each partition based on its fault density and applies that ratio to the partition.

Career Highlights

The patent reflects work on tailoring scan compression to differences in fault density among integrated-circuit partitions. This approach links partition-level fault information with the compression ratios used in scan testing.

Collaborations

Bhagat is associated with International Business Machines Corporation. His listed coworker is Baalaji Ramamoorthy Konda.

Conclusion

Hardik Bhagat’s patent focuses on using fault density to determine scan compression ratios for integrated-circuit partitions, connecting test data with partition-specific compression.