The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2015
Filed:
Apr. 12, 2013
International Business Machines Corporation, Armonk, NY (US);
Hardik Bhagat, Karnataka, IN;
Baalaji R. Konda, Karnataka, IN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A processor-implemented method for determining scan compression ratio based on fault density. The processor-implemented method may include calculating, by a processor, a fault density value for each of a plurality of partitions of an integrated circuit. The fault density is computed by the processor based on a ratio of a total number of faults per partition to a total number of flip-flops per partition. The processor-implemented method further includes the processor determining a compression ratio for each of the plurality of partitions based on the fault density value for each of the plurality of partitions and applying the compression ratio to each of the plurality of the partitions of the integrated circuit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile