Plainsboro, NJ, United States of America

Haoyu Wang

This inventor holds 1 USPTO granted patent and 8 published patent applications. Top assignee: Nec Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haoyu Wang. Retrieved from https://idiyas.com/inventor/haoyu-wang-iw4bc9t2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Haoyu Wang - Innovator in Root Cause Analysis

Introduction

Haoyu Wang is a notable inventor based in Plainsboro, NJ (US). He has made significant contributions to the field of root cause analysis through his innovative patent. His work focuses on enhancing the methods and systems used for identifying the root causes of system anomalies.

Latest Patents

Haoyu Wang holds a patent for "Early root cause localization." This patent describes methods and systems for root cause analysis that combine system logs and system metrics into time-series data. Individual root cause analysis is performed to determine individual causal scores for respective system entities. Topological root cause analysis captures topological patterns of system anomalies. The individual causal scores and the topological patterns are integrated by a weighted sum, allowing for effective corrective actions on identified entities.

Career Highlights

Haoyu Wang is currently employed at NEC Corporation, where he continues to develop innovative solutions in his field. His expertise in root cause analysis has positioned him as a valuable asset to his organization.

Collaborations

Haoyu Wang has collaborated with notable colleagues, including Zhengzhang Chen and Haifeng Chen. Their combined efforts contribute to advancing the technology and methodologies in root cause analysis.

Conclusion

Haoyu Wang's contributions to root cause analysis through his patent demonstrate his commitment to innovation and problem-solving in technology. His work continues to influence the field and improve system reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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