Haoran Li

Title: Haoran Li: Innovator in Quartz Crystal Microbalance Technology

Introduction

Haoran Li is a prominent inventor based in Nanjing, China. He has made significant contributions to the field of quartz crystal microbalance technology. With a total of 3 patents, his work focuses on enhancing measurement sensitivity and detection methods.

Latest Patents

One of Haoran Li's latest patents is a quartz crystal microbalance and detection method and apparatus based on quartz crystal microbalance. This innovative device includes a resonant module, an optical imaging module, and a data processing module. The optical imaging module features a microscope and an image acquisition device. An assembly model is fixed on the microscope objective stage. The image acquisition device performs optical imaging on a surface of the QCM chip magnified by the microscope to obtain an image, which is then sent to the data processing module. This module analyzes and processes the image to determine the optical resonant frequency of a sample to be tested. The mass of the sample is determined according to the optical resonant frequency. This advancement improves QCM measurement sensitivity without the limitations of the Sauerbrey equation. Additionally, it allows for the simultaneous measurement of resonant frequencies at different positions on the surface of the QCM chip, enabling multi-channel and multi-sample detection on a single chip.

Career Highlights

Haoran Li is affiliated with Nanjing University, where he continues to push the boundaries of research and innovation in his field. His work has garnered attention for its practical applications and contributions to scientific understanding.

Collaborations

Haoran Li collaborates with notable colleagues such as Wei Wang and Yunlong Lian, further enhancing the impact of his research through teamwork and shared expertise.

Conclusion

Haoran Li's innovative work in quartz crystal microbalance technology exemplifies the spirit of invention and research. His contributions are paving the way for advancements in measurement techniques and applications.