The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Apr. 28, 2025
Applicant:

Nanjing University, Nanjing, CN;

Inventors:

Wei Wang, Nanjing, CN;

Yunlong Lian, Nanjing, CN;

Ben Niu, Nanjing, CN;

Haoran Li, Nanjing, CN;

Assignee:

NANJING UNIVERSITY, Nanjing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/02 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/022 (2013.01); G01N 29/2418 (2013.01); G01N 2291/014 (2013.01);
Abstract

A quartz crystal microbalance includes a resonant module, an optical imaging module, and a data processing module. The optical imaging module includes a microscope, and an image acquisition device. An assembly model is fixed on the microscope objective stage. The image acquisition device performs optical imaging on a surface of QCM chip magnified by the microscope to obtain an image, and sends the image to the data processing module. The data processing module analyzes and processes the image to determine an optical resonant frequency of a sample to be tested. The mass of the sample to be tested is determined according to the optical resonant frequency. QCM measurement sensitivity is improved, without the limitation of Sauerbrey equation, and the resonant frequencies of different positions on the surface of QCM chip are simultaneously measured, thus realizing the multi-channel and multi-sample detection of a single chip.


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