This inventor holds 1 USPTO granted patent. Top assignee: Nanjing University. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: The Innovations of Ben Niu
Introduction
Ben Niu is a prominent inventor based in Nanjing, China. He has made significant contributions to the field of measurement technology, particularly through his innovative work on quartz crystal microbalance systems. His inventions have the potential to enhance the accuracy and efficiency of various detection methods.
Latest Patents
Ben Niu holds a patent for a "Quartz crystal microbalance and detection method and apparatus based on quartz crystal microbalance." This invention includes a resonant module, an optical imaging module, and a data processing module. The optical imaging module features a microscope and an image acquisition device. The device performs optical imaging on the surface of a QCM chip, magnified by the microscope, to obtain an image. This image is then sent to the data processing module, which analyzes it to determine the optical resonant frequency of a sample. The mass of the sample is determined based on this frequency. This innovation improves QCM measurement sensitivity, overcoming the limitations of the Sauerbrey equation, and allows for simultaneous measurement of resonant frequencies at different positions on the QCM chip, enabling multi-channel and multi-sample detection.
Career Highlights
Ben Niu is affiliated with Nanjing University, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in various scientific fields.
Collaborations
He collaborates with notable colleagues, including Wei Wang and Yunlong Lian, who contribute to his research endeavors.
Conclusion
Ben Niu's innovative work in quartz crystal microbalance technology exemplifies the impact of modern inventions on scientific measurement techniques. His contributions are paving the way for advancements in detection methods and enhancing the capabilities of measurement systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
