Hangzhou, China

Haoran Jin

This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Haoran Jin. Retrieved from https://idiyas.com/inventor/haoran-jin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Haoran Jin - Innovator in Ultrasonic Imaging Technology

Introduction

Haoran Jin is a prominent inventor based in Hangzhou, China. He has made significant contributions to the field of ultrasonic imaging technology. His innovative approach focuses on enhancing the detection of defects in multi-layer structures.

Latest Patents

Haoran Jin holds a patent for an "Efficient ultrasonic phased array phase shift migration imaging method for defects in multi-layer structure." This invention provides a systematic method for imaging defects within multi-layer structures. The process involves transforming full matrix capture data into a frequency-wavenumber domain using three-dimensional fast Fourier transform. It also includes extrapolating surface wave fields and performing focus imaging to obtain accurate imaging results.

Career Highlights

Haoran Jin is affiliated with Zhejiang University, where he continues to advance research in ultrasonic technology. His work has garnered attention for its practical applications in various industries, particularly in non-destructive testing and evaluation.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Haoran Jin's innovative contributions to ultrasonic imaging technology demonstrate his commitment to advancing the field. His patent reflects a significant step forward in the efficient detection of defects in complex structures.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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