The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Feb. 14, 2023
Zhejiang University, Hangzhou, CN;
Peng Zhao, Hangzhou, CN;
Kaipeng Ji, Hangzhou, CN;
Chaojie Zhuo, Hangzhou, CN;
Haoran Jin, Hangzhou, CN;
Jian Chen, Hangzhou, CN;
Jianzhong Fu, Hangzhou, CN;
ZHEJIANG UNIVERSITY, Hangzhou, CN;
Abstract
The present invention provides an efficient ultrasonic phased array phase shift migration imaging method for the defect in a multi-layer structure, including the following steps: (1) transforming full matrix capture data of a multi-layer structure to a frequency-wavenumber domain by means of three-dimensional fast Fourier transform; (2) for any non-traversed layer in the multi-layer structure, extrapolating a surface wave field of the multi-layer structure to an upper interface of the non-traversed layer, to obtain wave field information of the non-traversed layer; (3) according to the obtained wave field information, performing focus imaging on the non-traversed layer in the frequency-wavenumber domain; and (4) repeating the steps (2) and (3), until all layers are traversed, to obtain an imaging result of the multi-layer structure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile