This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Hao Zhang - Innovator in Laser Wafer Singulation Technology
Introduction
Hao Zhang is a notable inventor based in Sichuan, China. He has made significant contributions to the field of laser technology, particularly in the area of wafer singulation. His innovative methods have the potential to enhance the efficiency and precision of semiconductor manufacturing.
Latest Patents
Hao Zhang holds a patent for a method titled "Splash resistant laser wafer singulation by crack length control." This patent describes a process for dicing a wafer that involves positioning the wafer with its top side on a tape material. The wafer contains multiple die separated by scribe streets. The method includes directing a first infrared (IR) laser beam at the bottom side of the wafer, focusing it to create an embedded crack line that does not reach the top side surface. A second IR laser beam is then used to extend this crack line to the top side surface, allowing for precise wafer singulation.
Career Highlights
Hao Zhang is currently employed at Texas Instruments Corporation, where he applies his expertise in laser technology to develop advanced manufacturing processes. His work has contributed to the company's reputation for innovation in the semiconductor industry.
Collaborations
Hao Zhang has collaborated with notable colleagues such as Yang Liu and Venkataramanan Kalyanaraman. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Hao Zhang's contributions to laser wafer singulation technology exemplify the impact of innovative thinking in the semiconductor industry. His patent and work at Texas Instruments Corporation highlight the importance of precision and efficiency in modern manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
