Wuhan, China

Hao Sun

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Black Sesame Technologies Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hao Sun. Retrieved from https://idiyas.com/inventor/hao-sun-xt07mg81

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hao Sun and Image Key-Point Detection

Introduction

Hao Sun is an inventor based in Wuhan, China, associated with Black Sesame Technologies Inc. His patent work addresses image key-point detection, a computer vision task that identifies important points within images.

Latest Patents

The supplied information lists 1 patent for Hao Sun: “Method and Apparatus for Detecting Key Point of Image, Computer Device and Storage Medium.” The invention preprocesses an image into a specified multi-channel format and processes it with a detection model containing a regression branch and an inter-frame residual branch. For discrete frames, the model uses regression predictions to determine key-point coordinates. For continuous frames, it combines regression predictions with inter-frame residual predictions. The approach is designed to support both image types and improve the stability of key-point detection.

Career Highlights

The available information connects Sun’s patent activity with Black Sesame Technologies Inc. and highlights his contribution to image-processing technology through a method for detecting key points in discrete and continuous frames.

Collaborations

The patent information identifies Black Sesame Technologies Inc. as the company associated with Sun’s work. No additional collaborators are specified in the supplied details.

Conclusion

Hao Sun’s listed invention applies a two-branch detection model to image key-point localization, with the goal of improving detection stability across different frame types.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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