Hao Ge

Title: The Innovations of Hao Ge

Introduction

Hao Ge is an accomplished inventor based in Fremont, California. He has made significant contributions to the field of error detection in memory arrays. His innovative work has led to the development of a patented technology that enhances the reliability of data signals.

Latest Patents

Hao Ge holds a patent for the "Auto-calibration of error detection signals." This patent describes methods, systems, and devices for auto-calibration of error detection signals. The technology involves injecting an error into a data signal obtained from a memory array. After the error is injected, the data signal is applied to an error detection circuit, which outputs an error signal. The error signal is delayed relative to a control signal by a specific amount. A timing signal that controls the propagation of the error signal is obtained by delaying the control signal by another amount. By comparing the error signal and the timing signal, a third amount for delaying the control signal is determined.

Career Highlights

Hao Ge is currently employed at Micron Technology Incorporated, where he continues to innovate and develop new technologies. His work focuses on improving data integrity and error detection in memory systems. With a patent portfolio that includes his recent innovation, he has established himself as a key player in the field.

Collaborations

Hao Ge collaborates with talented professionals in his field, including his coworker Jaeil Kim. Together, they work on advancing technologies that enhance memory systems and data reliability.

Conclusion

Hao Ge's contributions to the field of error detection and memory technology are noteworthy. His patented innovations demonstrate his commitment to improving data integrity in modern computing systems.