Uster, Switzerland

Hansueli Meyer

This inventor holds 1 USPTO granted patent. Top assignee: Qiagen Instruments Ag. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hansueli Meyer. Retrieved from https://idiyas.com/inventor/hansueli-meyer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Hansueli Meyer: Innovator in Temperature Measurement Verification

Introduction

Hansueli Meyer is a notable inventor based in Uster, Switzerland. He has made significant contributions to the field of temperature measurement, particularly in micro-environments. His innovative approach has led to the development of a unique method that enhances the accuracy of temperature control in various devices.

Latest Patents

Hansueli Meyer holds a patent for a "Method for verifying a temperature measurement in a micro-environment and system for verifying a temperature measurement in a micro-environment." This invention is particularly useful for analyzing the temperature control of devices that establish defined temperatures in micro-environments. The method includes an Optical Temperature Verification step, which is especially effective for thermal cyclers during calibration.

Career Highlights

Meyer is currently associated with Qiagen Instruments AG, where he applies his expertise in temperature measurement technologies. His work has been instrumental in advancing the capabilities of devices used in various scientific and industrial applications.

Collaborations

He has collaborated with notable colleagues, including Dirk Leber and Stephan Baehler, contributing to a dynamic work environment that fosters innovation and development.

Conclusion

Hansueli Meyer is a distinguished inventor whose work in temperature measurement verification has made a significant impact in his field. His contributions continue to influence the development of precise temperature control technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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