The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Oct. 22, 2012
Applicant:
Qiagen Instruments Ag, Hombrechtikon, CH;
Inventors:
Assignee:
QIAGEN INSTRUMENTS AG, Hombrechtikon, CH;
Primary Examiner:
Int. Cl.
CPC ...
G01K 11/00 (2006.01); G01K 15/00 (2006.01); G01K 11/20 (2006.01); G01K 11/16 (2006.01);
U.S. Cl.
CPC ...
G01K 15/007 (2013.01); G01K 11/165 (2013.01); G01K 11/20 (2013.01); G01K 15/005 (2013.01);
Abstract
The present invention pertains to a method suitable for analyzing the temperature control of a device which is supposed to establish a defined temperature in a micro-environment, said method comprising a first Optical Temperature Verification step which comprises The respective method is very suitable to analyze the temperature control of a thermal cycler, in particular during a calibration.
Leber, Dirk. (2018). Method for verifying a temperature measurement in a micro-environment and system for verifying a temperature measurement in a micro-environment (U.S. Patent No. 9976917). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9976917
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile