Wetzlar, Germany

Hans-Werner Stankewitz


Average Co-Inventor Count = 1.4

ph-index = 4

Forward Citations = 53(Granted Patents)


Location History:

  • Steindorf, DE (1979 - 1983)
  • Wetzlar, DE (1989 - 2003)

Company Filing History:


Years Active: 1979-2003

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9 patents (USPTO):Explore Patents

Title: The Innovations of Hans-Werner Stankewitz

Introduction

Hans-Werner Stankewitz is a notable inventor based in Wetzlar, Germany. He has made significant contributions to the field of microscopy, holding a total of nine patents. His work has advanced the capabilities of optical instruments, enhancing their functionality and precision.

Latest Patents

One of his latest patents is the Variable Epi-Illumination Interference Attachment. This innovative attachment can be mounted onto the objective of a microscope as a two-ray interference attachment module. It features a reference mirror and several beam splitters affixed on a carrier, such as a turret plate. The beam splitters exhibit specific reflection/transmission characteristics, particularly 20/80, 35/65, 43/57, and 50/50. The reference mirror demonstrates a reflection value of 85 percent. This invention allows for the observation and measurement of objects with varying reflection values without contrast issues. Another significant patent is the Condenser System for Microscopes, which further enhances the functionality of these essential tools in scientific research.

Career Highlights

Throughout his career, Hans-Werner Stankewitz has worked with prominent companies in the microscopy field, including Ernst Leitz Wetzlar GmbH and Leica Mikroskopie und Systeme GmbH. His expertise and innovative spirit have made a lasting impact on the industry.

Collaborations

He has collaborated with notable colleagues such as Burkhard Neumann and Hans Determann, contributing to various advancements in microscopy technology.

Conclusion

Hans-Werner Stankewitz's contributions to the field of microscopy through his patents and collaborations have significantly advanced optical technology. His work continues to influence the way scientists observe and measure microscopic objects.

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