Ernst Leitz Wetzlar Gmbh

Leica Mikroskopie Und Systeme Gmbh

Leica Microsystems Wetzlar Gmbh

Hans-Werner Stankewitz

Peter Euteneuer

Robert Lisfeld

Guenter Reinheimer

Karl Wieber

Burkhard Neumann

Hans Determann

Ute Gehrmann

Rolf Krueger

An epi-illumination interference attachment according to Mirau that can be mounted onto the objective ( ) of a microscope as a two-ray interference attachment module ( ). The attachment has a reference mirror ( ) and several beam splitters ( ) which are affixed on a carrier such as turret plate ( ). The beam splitters ( ) show specific reflection/transmission characteristics (R/T values), especially 20/80, 35/65, 43/57, and 50/50. The reference mirror ( ) shows, for instance a reflection value of 85 percent. With the installation according to this invention, objects ( ) with very different reflection values can be observed and measured without any contrast problems.

Variable epi-illumination interference attachment

Condenser system for microscopes

Process and device for contrasting objects to be microscopically examined

Bright-field transmitted-light lighting device for microscopes

Epi-illumination system for microscopes

An optical component is described which can be introduced into a finite or an infinite beam path and which is provided with a spectrally selective filtering characteristic and thus as the same time compensates the thereby generated geometric-optical negative influence by appropriate image-relevant compensation measures. The optical component exhibits at least one optically effective, non-planar surface. It has, for example, the property of completely absorbing visible light and of being completely transparent to shorter- or longer-wavelength light. In addition to this, a laser autofocus arrangement known per se is described, which is equipped with the optical component according to the invention, whereby a dark field illumination with an incident light microscope can be achieved while maintaining the autofocus function.

Field stop for dark field illumination in autofocus optical device

An incident light, bright-field, Kohler illuminating device for a microscope which reflects an illuminating beam into one half of the pupil of a microscope objective, which avoids vignetting of the field of vision without requiring especially short objectives, which can provide illumination with polarized light, and which can be added to any transmitted light microscope including microscopes with revolvable turrets without requiring a specially designed microscope stand.

Incident light, bright-field Kohler illuminating device

An apparatus for varying the position of a field stop with respect to a microscope substage illuminator includes a carrier for slidably mounting the field stop on the illuminator so as to move in a direction transverse to the optical axis of the illuminator. An annular element controlling the aperture of the field stop is pivotally mounted within the carrier and is coupled to a knurled ring projecting radially and upwardly from the diaphragm carrier. The knurled ring is in turn pivoted within the diaphragm carrier and preferably carries a circular line inscribed thereon which is concentric with the field stop in order to facilitate adjustment of the field stop.

Apparatus for simultaneous adjustment of the position and aperture of a

A process and apparatus is disclosed for automatically realizing Kohler's Principle of Illumination in microscopes and the like in which the illumination means of the microscope is adjusted to fully take Kohler's Principle of Illumination into account. Optimization is achieved by sensing the extent of illumination, preferably with photoelectric type sensors, which generate signals proportional to the brightness of illumination. The signals are converted into control signals in a converter stage which in turn control motor means which serve to adjust the openings of at least one diaphragm and/or the focal length of an illumination pancratics in the system. The sensing means are adjustably positioned so that it may be moved depending on the objective and magnification used.

Process and apparatus for automatically realizing Kohler's principle of

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Wetzlar, Germany

Hans-Werner Stankewitz