Karlsruhe, Germany

Hans-Ulrich Maier

This inventor holds 1 USPTO granted patent. Top assignee: Siemens Aktiengesellschaft. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hans-Ulrich Maier. Retrieved from https://idiyas.com/inventor/hans-ulrich-maier

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Innovations of Hans-Ulrich Maier

Introduction

Hans-Ulrich Maier is a notable inventor based in Karlsruhe, Germany. He has made significant contributions to the field of data processing systems. His innovative approach has led to the development of a unique method for data recovery.

Latest Patents

Hans-Ulrich Maier holds a patent for a "Method and device for non-destructively recovering data in a data processing system." This invention focuses on a method for recovering data exclusively in predetermined units or installations. The recovery program is executed on the data processing system, which includes a testing procedure of specific hardware features. All features characteristic of the data and the system are stored in a control file of the recovery program. He has 1 patent to his name.

Career Highlights

Hans-Ulrich Maier is associated with Siemens Aktiengesellschaft, a leading global technology company. His work at Siemens has allowed him to explore and implement innovative solutions in data processing. His expertise in this area has made him a valuable asset to the company.

Collaborations

One of his notable coworkers is Joachim Rohde. Their collaboration has contributed to advancements in their respective fields.

Conclusion

Hans-Ulrich Maier's contributions to data processing systems exemplify the spirit of innovation. His patent reflects a commitment to enhancing data recovery methods, showcasing his expertise and dedication to technological advancement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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