This inventor holds 1 USPTO granted patent. Top assignee: Suss Microtec Test Systems Gmbh. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: The Innovations of Hans-Juergen Fleischer
Introduction
Hans-Juergen Fleischer is a notable inventor based in Priestewitz, Germany. He has made significant contributions to the field of wafer probe technology. His work focuses on enhancing the precision and efficiency of calibration processes in probe stations.
Latest Patents
Fleischer holds a patent for a procedure that reproduces a calibration position of an aligned and subsequently displaced calibration substrate in a probe station. This innovative method involves a wafer probe station equipped with a wafer chuck and a probe needle arrangement. The procedure utilizes first and second measurement systems to calculate a new offset position of the calibration substrate after loading a second wafer. The wafer chuck is then driven by a 4-axis manipulator stage to the new calibration position.
Career Highlights
Fleischer is associated with Suss Microtec Test Systems GmbH, a company known for its advanced testing solutions in the semiconductor industry. His work at the company has been instrumental in developing technologies that improve wafer testing processes.
Collaborations
Fleischer has collaborated with notable colleagues, including Joerg Kiesewetter and Axel Schmidt. Their combined expertise has contributed to advancements in the field of probe technology.
Conclusion
Hans-Juergen Fleischer's innovative work in wafer probe technology exemplifies the importance of precision in semiconductor testing. His contributions continue to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile