Backnang, Germany

Hans-Joachim Trefz

This inventor holds 2 USPTO granted patents. Top assignee: Carl Zeiss Smt Gmbh. Active years: 2014-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hans-Joachim Trefz. Retrieved from https://idiyas.com/inventor/hans-joachim-trefz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 11.0

ph-index = 2

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2014-2017

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2 patents (USPTO):Explore Patents

Title: The Innovations of Hans-Joachim Trefz

Introduction

Hans-Joachim Trefz is a notable inventor based in Backnang, Germany. He has made significant contributions to the field of optical engineering, particularly through his innovative patents. With a total of 2 patents, Trefz has demonstrated his expertise and creativity in developing new methods and devices.

Latest Patents

Trefz's latest patents include a method and device for connecting an optical element to a frame. This invention focuses on the material-fit connection of an optical element to a frame, showcasing his commitment to enhancing optical technology. The details of this patent reveal a sophisticated approach to ensuring durability and functionality in optical devices.

Career Highlights

Hans-Joachim Trefz is currently employed at Carl Zeiss SMT GmbH, a leading company in the field of optical systems. His work at this esteemed organization has allowed him to collaborate with other talented professionals and contribute to groundbreaking advancements in optical technology.

Collaborations

Some of Trefz's notable coworkers include Armin Schoeppach and Gennady Fedosenko. Their collaborative efforts have likely played a role in the successful development of innovative optical solutions.

Conclusion

In summary, Hans-Joachim Trefz is a distinguished inventor whose work has significantly impacted the optical engineering field. His patents and contributions reflect a deep understanding of technology and innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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