This inventor holds 2 USPTO granted patents. Top assignee: Nanofocus Ag. Active years: 2005.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2005
Title: The Innovations of Hans-Hermann Schreier
Introduction
Hans-Hermann Schreier is a notable inventor based in Oldenburg, Germany. He has made significant contributions to the field of microscopy and surface measurement technologies. With a total of 2 patents, his work focuses on enhancing the precision and efficiency of technical surface analysis.
Latest Patents
One of his latest patents is a method and device for producing height images of technical surfaces with microscopic resolution. This innovative method utilizes a confocal measuring microspace to create detailed height images. The sample is displaced in a controlled manner towards the microspace, allowing for images to be captured at defined distances using a digital camera. The digitized images are then processed by a controller, where the maximum light intensity for each pixel is detected, indicating the height of the sample. This continuous displacement and discrete image exposure technique significantly improve the accuracy of surface measurements.
Another patent involves scanning using position transmission for triggering the recording of measured values. In this method, the displacement movement is initiated by a software instruction, generating trigger pulses at discrete intervals. The measured values are stored and transmitted asynchronously to the controller, enhancing the efficiency of surface topology measurements.
Career Highlights
Hans-Hermann Schreier is currently associated with Nanofocus AG, a company known for its advanced measurement solutions. His work at Nanofocus AG has been instrumental in developing cutting-edge technologies that push the boundaries of microscopic measurement.
Collaborations
Throughout his career, Hans-Hermann has collaborated with esteemed colleagues such as Jürgen Valentin and Joachim Jordan. These collaborations have fostered innovation and contributed to the advancement of measurement technologies.
Conclusion
Hans-Hermann Schreier's contributions to the field of microscopy and surface measurement are noteworthy. His innovative patents and work at Nanofocus AG reflect his commitment to advancing technology in this domain. His efforts continue to influence the industry and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile