The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Jan. 11, 2001
Jürgen Valentin, Duisburg, DE;
Joachim Jordan, Nettetal-Kaldenkirchen, DE;
Hans-hermann Schreier, Oldenburg, DE;
Jürgen Valentin, Duisburg, DE;
Joachim Jordan, Nettetal-Kaldenkirchen, DE;
Hans-Hermann Schreier, Oldenburg, DE;
NanoFocus AG, Oberhausen-Rhld., DE;
Abstract
A method for producing height images of technical surfaces with microscopic resolution uses a confocal measuring microspace. The sample to be measured is displaced in the direction (Z direction) towards the microspace in a controlled manner and images are produced at defined distances with a digital camera. The digitized images recorded are transmitted to a controller (PC) for further processing and evaluation and the light intensity maximum for every pixel is detected, the position of the maximum indicating the height of the sample to be measured. The sample is displaced in a continuous manner and that the image exposures are triggered at discrete localized distances. The intensities of the N individual images recorded and digitized in the above manner are stored in the PC in such a manner that a number N of subsequent storage locations is occupied for every pixel.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile