Hans Dieter Huber

Title: Innovations by Hans Dieter Huber

Introduction

Hans Dieter Huber is an accomplished inventor based in San Ramon, California. He has made significant contributions to the field of integrated circuit testing. His innovative approach has led to the development of a unique patent that enhances the reliability of testing tools for electronic devices.

Latest Patents

One of Hans Dieter Huber's notable patents is titled "Systems and methods for reliable integrated circuit device test tooling." This invention features a test probe assembly designed for testing packaged integrated circuit (IC) devices. The assembly includes a plurality of probes that maintain reliable electrical contact with corresponding device under test (DUT) contacts when subjected to a compliant force. The design incorporates a pad that provides mechanical support and electric coupling for the probes, while a PCB/interposer supports the pad. Notably, some embodiments of the probes utilize a hard core material such as diamond, enhancing their durability and effectiveness.

Career Highlights

Hans Dieter Huber has been associated with Essai, Inc., where he has applied his expertise in integrated circuit testing. His work has been instrumental in advancing the technology used in the industry. With a focus on reliability and efficiency, he has contributed to the development of tools that are essential for modern electronic testing.

Collaborations

Throughout his career, Hans has collaborated with talented individuals such as Nasser Barabi and Joven R Tienzo. These collaborations have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Hans Dieter Huber's contributions to the field of integrated circuit testing exemplify the spirit of innovation. His patent and collaborative efforts reflect a commitment to enhancing technology in the electronics industry. His work continues to influence the development of reliable testing tools for integrated circuits.