Eindhoven, Netherlands

Hanno Sebastian Von Harrach

USPTO Granted Patents = 4 


Average Co-Inventor Count = 3.0

ph-index = 3

Forward Citations = 29(Granted Patents)


Company Filing History:


Years Active: 2011-2015

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4 patents (USPTO):Explore Patents

Title: Hanno Sebastian Von Harrach: Innovator in Electron Microscopy

Introduction

Hanno Sebastian Von Harrach is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of electron microscopy, holding a total of 4 patents. His work focuses on enhancing the capabilities of electron microscopes through innovative designs and technologies.

Latest Patents

Among his latest patents is a groundbreaking invention titled "Mounting structures for multi-detector electron microscopes." This patent describes a detector support for an electron microscope that includes a detector support ring and flexible elements. The design allows for at least two detectors to be arranged circumferentially around the optical axis of the electron microscope, ensuring that the optical axes of the detectors intersect with the microscope's optical axis. This configuration maintains a relatively constant target point over temperature changes. Another significant patent is the "X-ray detector for electron microscope," which features multiple detectors arranged in a ring within a specimen chamber. This arrangement provides a large solid angle of collection, improving detection capabilities regardless of the sample's tilt.

Career Highlights

Hanno has worked with prominent companies in the field, including FEI Company and PEI Company. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in electron microscopy technology.

Collaborations

Hanno has collaborated with notable colleagues such as Bert Henning Freitag and Pleun Dona. These partnerships have fostered a creative environment that encourages the exchange of ideas and expertise.

Conclusion

Hanno Sebastian Von Harrach is a distinguished inventor whose work in electron microscopy has led to significant advancements in the field. His innovative patents and collaborations highlight his commitment to enhancing scientific research through technology.

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