Hanjun Jiang

Title: Hanjun Jiang: Innovator in Analog and Mixed-Signal Circuit Testing

Introduction

Hanjun Jiang is a notable inventor based in Ames, Iowa. He has made significant contributions to the field of analog and mixed-signal circuit testing. His innovative approach has led to the development of a unique method that enhances the performance of testing circuits.

Latest Patents

Hanjun Jiang holds a patent titled "Method for testing analog and mixed-signal circuits using dynamic element matching for source linearization." This method can be utilized in both production and built-in self-test environments. It involves generating an excitation signal for testing through dynamic element matching, which enhances the performance of the test signal generator. Additionally, the method includes measuring the output of the device under test (DUT) using dynamic element matching to improve the performance of the output measurement device. This patent showcases his expertise in signal generators and circuits.

Career Highlights

Hanjun Jiang is associated with the Iowa State University Research Foundation Inc. His work there has allowed him to focus on advancing technologies related to circuit testing. With a patent portfolio that includes 1 patent, he has established himself as a valuable contributor to the field.

Collaborations

Hanjun has collaborated with notable colleagues, including Beatriz Olleta and Degang James Chen. Their combined efforts have furthered research and development in their respective areas of expertise.

Conclusion

Hanjun Jiang's innovative methods in testing analog and mixed-signal circuits highlight his significant contributions to the field. His work continues to influence advancements in circuit testing technologies.