The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2009
Filed:
Jul. 30, 2004
Beatriz Olleta, Baltimore, MD (US);
Hanjun Jiang, Ames, IA (US);
Degang Chen, Ames, IA (US);
Randall L. Geiger, Boone, IA (US);
Beatriz Olleta, Baltimore, MD (US);
Hanjun Jiang, Ames, IA (US);
Degang Chen, Ames, IA (US);
Randall L. Geiger, Boone, IA (US);
Iowa State University Research Foundation, Inc., Ames, IA (US);
Abstract
A method of testing an analog and/or mixed-signal circuit can be used in either a production or a built-in self test environment. The method includes generating an excitation signal for testing by using dynamic element matching for performance enhancement of the test signal generator that applies an excitation, and/or by measuring an output of the DUT using dynamic element matching for performance enhancement of an output measurement device. Signal generators and circuits using aspects of the method are also discussed.