Seoul, South Korea

Han-Moo Lee

This inventor holds 3 USPTO granted patents. Top assignee: Phicom Corporation. Active years: 2009-2012.


Average Co-Inventor Count = 1.2

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2009-2012

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3 patents (USPTO):Explore Patents

Title: Innovations of Han-Moo Lee

Introduction

Han-Moo Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of semiconductor technology. With a total of three patents to his name, his work focuses on enhancing the efficiency and reliability of probe cards used in testing semiconductor devices.

Latest Patents

Han-Moo Lee's latest patents include a method of fabricating cantilever type probes and a method of fabricating probe cards using the same. The first patent discloses a method for creating cantilever type probes by forming grooves in the tip and dummy tip regions of a substrate. This innovative approach minimizes physical and chemical damage during the fabrication process, ensuring greater stability and fewer defects in the final product. The second patent introduces a probe card designed for easy assembly and maintenance. It features a unique installation member and a printed circuit board (PCB) that work together to maintain the controlled level of a space transformer, even under thermal deformation during testing.

Career Highlights

Han-Moo Lee is currently employed at Phicom Corporation, where he continues to develop cutting-edge technologies in the semiconductor industry. His expertise and innovative mindset have positioned him as a valuable asset to his company.

Collaborations

One of his notable collaborators is Yong-Hwi Jo, with whom he has worked closely on various projects.

Conclusion

Han-Moo Lee's contributions to semiconductor technology through his patents demonstrate his commitment to innovation and excellence in the field. His work not only enhances the functionality of probe cards but also sets a standard for future developments in semiconductor testing.

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