This inventor holds 1 USPTO granted patent. Top assignee: Peking University. Active years: 2022.
Company Filing History:
Years Active: 2022
Title: Hailong Lu: Innovator in Light Scattering Measurement Technology
Introduction
Hailong Lu is a prominent inventor based in Beijing, China. He has made significant contributions to the field of optical fiber technology, particularly in the measurement of light scattering parameters. His innovative work has implications for both fundamental research and practical applications in various industries.
Latest Patents
Hailong Lu holds a patent for a "Light scattering parameter measurement system and its measurement method." This patent discloses a system that utilizes dual-frequency scattering interference technology to achieve distributed measurement of Rayleigh scattering parameters in optical fibers. The method allows for the decoupling of the Rayleigh scattering coefficient and phase retardance through simple filtering techniques. This advancement is crucial for obtaining accurate measurements of Rayleigh scattering parameters, which are essential for various research applications.
Career Highlights
Hailong Lu is affiliated with Peking University, where he continues to engage in cutting-edge research. His work has garnered attention for its innovative approach to optical measurements, contributing to the advancement of optical fiber technology. His expertise in this area has positioned him as a key figure in the field.
Collaborations
Hailong Lu has collaborated with notable colleagues, including Xiangge He and Min Zhang. These partnerships have fostered a collaborative environment that enhances the research output and innovation in their respective fields.
Conclusion
Hailong Lu's contributions to light scattering measurement technology exemplify the impact of innovative thinking in scientific research. His work not only advances the understanding of optical fibers but also paves the way for future developments in the field.