The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2022
Filed:
Dec. 09, 2020
Peking University, Beijing, CN;
Xiangge He, Beijing, CN;
Min Zhang, Beijing, CN;
Fei Liu, Beijing, CN;
Lijuan Gu, Beijing, CN;
Hailong Lu, Beijing, CN;
Peking University, Beijing, CN;
Abstract
The application discloses a light scattering parameter measurement system and its measurement method. Dual-frequency scattering interference technology is adopted to obtain distributed measurement of Rayleigh scattering parameters in an optical fiber. The Rayleigh scattering coefficient r and phase retardance θ are modulated on different components of the interference signal respectively by using the dual-frequency interference technology. The Rayleigh scattering coefficient r and phase retardance θ can be decoupled by simple filtering, to obtain separate measurements. A linear stretch is applied to the optical fiber under test, to add uniform phase change signals at all positions of the optical fiber under test. As a result, the term containing only Rayleigh scattering coefficient r can be extracted by low-pass filtering. The direct measurement of Rayleigh scattering parameters is of great significance to fundamental and application researches related to Rayleigh scattering of optical fiber.