San Diego, CA, United States of America

Hai Yu

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Here Global B.v.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hai Yu. Retrieved from https://idiyas.com/inventor/hai-yu-3e88kwnq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hai Yu and Object-Pose Detection from Overhead Imagery

Introduction

Hai Yu is an inventor based in San Diego, California. His patent work includes a computer-vision approach for detecting objects and estimating their poses from overhead imagery.

Latest Patents

The provided information lists one patent associated with Hai Yu: “Method, Apparatus, and System for Detecting an Object and Associated Pose from Overhead Imagery Data.” The method processes an image with a feature representation network to generate points representing a detected object. Each point carries an attribute identifying a geometric part of the object. The network also constructs a bounding box around the points, and the system uses the box and point attributes to determine the object’s pose. It can then provide the detected object, its pose, or both as output. The listed patent count is 1 patent.

Career Highlights

The available details identify Hai Yu as an inventor associated with this patent and list Here Global B.V. as his company. The invention focuses on combining image features, geometric information, and bounding-box analysis to identify objects and estimate their orientation.

Collaborations

The provided information associates the patent with Here Global B.V. It does not specify additional collaborators or co-inventors.

Conclusion

Hai Yu’s listed patent presents a method for detecting objects and estimating their poses from overhead imagery, linking his work to computer vision and image-based spatial analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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