Munich, Germany

Hagen Raue

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Brooks Automation Gmbh. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hagen Raue. Retrieved from https://idiyas.com/inventor/hagen-raue

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Hagen Raue

Introduction

Hagen Raue is an inventor based in Munich, Germany. He is known for his innovative approach to the inspection of flat objects, particularly wafers. His work focuses on developing methods that enhance the accuracy and efficiency of defect detection in various applications.

Latest Patent Applications

Hagen Raue has filed a patent application for an "Inspection Method." This invention relates to a method for inspecting flat objects, which includes several steps. The process involves recording a digital image of the surface of multiple homogeneous objects in a series. Each digital image consists of numerous pixels, each assigned an intensity value. The method detects defects on the object surface by comparing the recorded image with a reference image. Notably, the images of the entire series are recorded before the comparison, and the reference image is generated from several or all images of the series, often by averaging them.

Conclusion

Hagen Raue's contributions to the field of inspection methods demonstrate his commitment to innovation and precision. His work has the potential to significantly impact industries that rely on the quality of flat objects.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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