Palo Alto, CA, United States of America

H Malcolm Ogle


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1982

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1 patent (USPTO):Explore Patents

Title: H Malcolm Ogle: Innovator in Lensmeter Technology

Introduction

H Malcolm Ogle is a notable inventor based in Palo Alto, California. He has made significant contributions to the field of optical technology, particularly in the development of lensmeters. His innovative work has led to the creation of a patented device that enhances the accuracy of refractive property measurements.

Latest Patents

Ogle holds a patent for a "Median point detecting apparatus for a lensmeter." This lensmeter is designed to determine the refractive properties of a test lens. It features an optical system that produces an ellipse of light at a detecting plane, which contains crucial information about the lens properties. The device includes a scanning linear photodiode array that generates video output signals, a first integrator for signal integration, and a compensator to adjust for the light sensitivity of each photodiode. Additionally, it has a second integrator to process the compensated video signals and a circuit to detect the median point of the light distribution. A microprocessor is employed to provide data identifying the median point based on the detection.

Career Highlights

Ogle is currently associated with Rodenstock Instruments Corporation, where he continues to innovate in the field of optical measurement devices. His work has been instrumental in advancing lensmeter technology, making it more efficient and reliable for users.

Collaborations

Throughout his career, Ogle has collaborated with esteemed colleagues such as George P Rigg and Tom N Cornsweet. These partnerships have contributed to the development of cutting-edge optical technologies.

Conclusion

H Malcolm Ogle's contributions to lensmeter technology exemplify his dedication to innovation in the optical field. His patented inventions continue to influence the accuracy and efficiency of refractive property measurements.

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