The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 1982

Filed:

Mar. 06, 1980
Applicant:
Inventors:

George P Rigg, Los Gatos, CA (US);

Tom N Cornsweet, Menlo Park, CA (US);

J Kirkwood Rough, San Jose, CA (US);

H Malcolm Ogle, Palo Alto, CA (US);

Wallace R Prunella, Sunnyvale, CA (US);

Lawrence H Schiller, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; H01J / ;
U.S. Cl.
CPC ...
356124 ; 250208 ;
Abstract

A lensmeter is disclosed for determining the refractive properties of a test lens, including an optical system to produce an ellipse of light at a detecting plane having information of such properties, a scanning linear photodiode array at the detecting plane for producing video output signals, a first integrator to integrate the video output signal from each photodiode, a compensator to compensate each video output signal for the light sensitivity of each photodiode, a second integrator to integrate the compensated video signals over the range of the distribution of light of an area of the ellipse being scanned, a circuit, connected to the second integrator, to detect the median point of the distribution, and a microprocessor to provide data identifying the median point in response to the detection.


Find Patent Forward Citations

Loading…