This inventor holds 1 USPTO granted patent. Top assignee: Orbotech Limited. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Gwan Sub Lee: Innovator in Defect Detection Technology
Introduction
Gwan Sub Lee is a notable inventor based in Incheon, South Korea. He has made significant contributions to the field of defect detection technology, particularly through his innovative patent. His work focuses on improving the accuracy of defect location reporting, which is crucial in various manufacturing processes.
Latest Patents
Gwan Sub Lee holds a patent for a "Panel design to improve accurate defect location report." This invention describes an array checker (AC) that includes software designed to implement a specific method. By utilizing this method, the array checker can detect the location of a defect and compensate for any shifts in that defect. The process involves generating reference lines on a panel, capturing an image of the panel through voltage imaging, and calculating offsets to ensure precise defect location.
Career Highlights
Gwan Sub Lee is currently employed at Orbotech Limited, a company known for its advanced technology solutions in the electronics manufacturing sector. His role at Orbotech Limited allows him to apply his innovative ideas and contribute to the development of cutting-edge technologies.
Collaborations
Throughout his career, Gwan Sub Lee has collaborated with talented individuals such as Yueh-Nan Chen and Nai-Wei Chen. These collaborations have likely enriched his work and contributed to the success of his inventions.
Conclusion
Gwan Sub Lee is a prominent figure in the realm of defect detection technology, with a patent that showcases his innovative approach to improving accuracy in manufacturing processes. His contributions continue to influence the industry positively.